オックスフォード・インストゥルメンツー事業部ページ
拡張
アプリケーション

Nanomaterial Growth and Characterisation

関連: 先進製造技術

"Nanomaterial Growth and Characterisation" encompasses a broad range of materials, research fields, and applications for which Atomic Force Microscopy (AFM) is widely used for characterisation. Please refer to the pages below for in-depth reviews of how AFM is used in each of these applications.

Common AFM applications in this category include:

プロダクト

ラーニングセンター