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Learn How to Probe Samples Under Applied Magnetic Fields

The latest Variable Field Module (VFM4) for MFP-3D atomic force microscopes can apply both in-plane and out-of-plane magnetic fields

Learn about the features and benefits of the VFM4:

  • Apply in-plane magnetic fields up to ±8000 G
  • Apply out-of-plane magnetic fields up to ±1200 G
  • Field strength is adjustable from software
  • Unique design using permanent magnets eliminates the heating and drift associated with electromagnets
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You might also be interested in our recent application note, "Magnetic Force Microscopy Under Applied Perpendicular Fields with Asylum Research AFMs." It discusses two case studies:  1) Domain structure in a Co/Ni thin film that exhibits perpendicular magnetic anisotropy, and, 2) Direct observation of magnetic skyrmions under applied fields.