Learn Why AFM is an Essential Tool for R&D of 2D Materials and Devices

(Free download, compliments of Asylum Research, the Technology Leader in Atomic Force Microscopy)

Learn about techniques to characterize:

• Nanoscale morphology
• Lattice structure
• Electrical and functional response
• Mechanical properties (storage and loss moduli)

See actual examples on materials including:

• CVD growth of molybdenum disulfide (MoS₂ )
• Graphene exfoliation in ionic liquids
• Lattice structure of a 2D optoelectronic material
• Visualizing strain in epitaxial graphene grown on boron nitride (BN)
• Mapping graphene grain orientation
• Characterization of a photoswitchable MoS₂ diode
• Tuning band gap of a tungsten diselenide (WSe₂ ) transistor<
• Interfacial phenomena in graphene