Is Atomic Force Microscopy the Best Tool for Your Surface Roughness Measurements?

Atomic force microscopy (AFM), also known as scanning probe microscopy (SPM), is the tool of choice for areal surface roughness measurements across many industries. New processes are producing lower-roughness surfaces that optical and stylus profilers cannot accurately measure. Download our white paper to learn:

• How AFM compares to other surface roughness measurement tools
• How modern AFMs make areal surface roughness measurements simpler and faster
• How AFM can measure not only surface roughness parameters (Sa and Sq), but also skewness (Ssk) and kurtosis (Sku) for a more complete description of surface texture
• How AFM is being used in the semiconductor, data storage, glass, and paper industries

(Free download, compliments of Asylum Research, the Technology Leader in Atomic Force Microscopy)